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Laser beam profiling with extended-image-range techniques

dc.contributor.authorQuiroga Mellado, Juan Antonio
dc.contributor.authorGonzález Moreno, Ricardo
dc.contributor.authorAlonso Fernández, José
dc.contributor.authorBernabeu Martínez, Eusebio
dc.date.accessioned2023-06-20T10:37:28Z
dc.date.available2023-06-20T10:37:28Z
dc.date.issued2005-02
dc.description© 2005 Society of Photo-Optical Instrumentation Engineers. This research was supported by the Comisión Interministerial de Ciencia y Technología under the projects DPI-2001/1369, DPI 2001/1238, and DPI2002-02104.
dc.description.abstractA method to enlarge the dynamic range of a CCD-based laser beam profiler is presented. The method is based on extended-image-range techniques. The algorithm that generates the extended-irradiance-range image is described in detail. An equivalent dynamic range and number of bits are defined and computed for the new profiling system. To test the method, experimental measurements of the principal widths of the output beam from a single-mode optical fiber have been made, as well as the Fraunhofer diffraction pattern of a 200-μm m pinhole back-illuminated by a HeNe laser.
dc.description.departmentDepto. de Óptica
dc.description.facultyFac. de Ciencias Físicas
dc.description.refereedTRUE
dc.description.sponsorshipMinisterio de Ciencia y Tecnología (MCYT)
dc.description.statuspub
dc.eprint.idhttps://eprints.ucm.es/id/eprint/23075
dc.identifier.doi10.1117/1.1840931
dc.identifier.issn0091-3286
dc.identifier.officialurlhttp://dx.doi.org/10.1117/1.1840931
dc.identifier.relatedurlhttp://opticalengineering.spiedigitallibrary.org
dc.identifier.urihttps://hdl.handle.net/20.500.14352/50810
dc.issue.number2
dc.journal.titleOptical Engineering
dc.language.isoeng
dc.publisherSpie-Soc Photo-Optical Instrumentation Engineers
dc.relation.projectID(DPI-2001/1369; DPI 2001/1238; DPI2002-02104)
dc.rights.accessRightsopen access
dc.subject.cdu535
dc.subject.keywordOptics
dc.subject.ucmÓptica (Física)
dc.subject.unesco2209.19 Óptica Física
dc.titleLaser beam profiling with extended-image-range techniques
dc.typejournal article
dc.volume.number44
dspace.entity.typePublication
relation.isAuthorOfPublication1c171089-8e25-448f-bcce-28d030f8f43a
relation.isAuthorOfPublicationf7b5b178-742c-418d-80d3-769a169f6dd9
relation.isAuthorOfPublication.latestForDiscovery1c171089-8e25-448f-bcce-28d030f8f43a

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