Mechanical-alloying and lattice distortions in ball-milled CuFe
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1997
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Editions Physique
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Abstract
A least-square fitting analysis of EXAFS data collected from partially-crystallized Fe_80B_20 thin films (t=15 nm), using data collected from pure phase standards of the crystallization products, was found effective in determining the relative atomic fraction of each crystalline phase present. This fitting scheme provides a means for the quantitative treatment of crystallization and precipitation kinetics in thin films and multilayered structures.
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©Editions Physique.EDP Sciences.
This research was carried out, in part, at the National Synchrotron Light Source (Brookhaven National Laboratories, Upton, NY), which is sponsored by the U.S. Department of Energy.