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Uncertainty Estimation by Convolution Using Spatial Statistics

dc.contributor.authorSánchez Brea, Luis Miguel
dc.contributor.authorBernabeu Martínez, Eusebio
dc.date.accessioned2023-06-20T10:46:23Z
dc.date.available2023-06-20T10:46:23Z
dc.date.issued2006-10
dc.description© IEEE. The work of L. M. Sánchez-Brea was supported by the Ministerio de Educación y Ciencia of Spain, within the ”Ramón y Cajal” program. The associate editor coordinating the review of this manuscript and approving it for publication was Dr. Til Aach. The authors thank Dr. J. Zoido, Dr. J. A. Quiroga, Dr. J. Alda, and Dr. A. Luis for their help and fruitful discussions.
dc.description.abstractKriging has proven to be a useful tool in image processing since it behaves, under regular sampling, as a convolution. Convolution kernels obtained with kriging allow noise filtering and include the effects of the random fluctuations of the experimental data and the resolution of the measuring devices. The uncertainty at each location of the image can also be determined using kriging. However, this procedure is slow since, currently, only matrix methods are available. In this work, we compare the way kriging performs the uncertainty estimation with the standard statistical technique for magnitudes without spatial dependence. As a result, we propose a much faster technique, based on the variogram, to determine the uncertainty using a convolutional procedure. We check the validity of this approach by applying it to one-dimensional images obtained in diffractometry and two-dimensional images obtained by shadow moire.
dc.description.departmentDepto. de Óptica
dc.description.facultyFac. de Ciencias Físicas
dc.description.refereedTRUE
dc.description.sponsorshipMinisterio de Educación y Ciencia (MEC), España
dc.description.statuspub
dc.eprint.idhttps://eprints.ucm.es/id/eprint/26718
dc.identifier.doi10.1109/TIP.2006.877505
dc.identifier.issn1057-7149
dc.identifier.officialurlhttp://dx.doi.org/10.1109/TIP.2006.877505
dc.identifier.relatedurlhttp://ieeexplore.ieee.org
dc.identifier.urihttps://hdl.handle.net/20.500.14352/51193
dc.issue.number10
dc.journal.titleIEEE Transactionns on Image Processing
dc.language.isoeng
dc.page.final3137
dc.page.initial3131
dc.publisherIEEE Institute of Electrical and Electronics Engineers
dc.relation.projectIDPrograma Ramón y Cajal
dc.rights.accessRightsopen access
dc.subject.cdu535
dc.subject.keywordSampling Theorem
dc.subject.keywordNoisy Images
dc.subject.keywordShannon
dc.subject.ucmÓptica (Física)
dc.subject.unesco2209.19 Óptica Física
dc.titleUncertainty Estimation by Convolution Using Spatial Statistics
dc.typejournal article
dc.volume.number15
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relation.isAuthorOfPublication.latestForDiscovery72f8db7f-8a25-4d15-9162-486b0f884481

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