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Cathodoluminescence spectroscopy for evaluation of defect passivation in GaSb

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dc.book.titleDiagnostic Techniques for Semiconductor Materials Processing
dc.contributor.authorPal, U
dc.contributor.authorPiqueras De Noriega, Francisco Javier
dc.contributor.authorDutta, P. S.
dc.contributor.authorBhat, H. L.
dc.contributor.authorDubey, G. C.
dc.contributor.authorKumar, V.
dc.contributor.authorDieguez, E.
dc.date.accessioned2023-06-20T21:09:47Z
dc.date.available2023-06-20T21:09:47Z
dc.date.issued1996
dc.description© Materials Research Soc. Symposium on Diagnostic Techniques for Semiconductor Materials Processing (2. 1995. Boston, USA)
dc.description.departmentDepto. de Física de Materiales
dc.description.facultyFac. de Ciencias Físicas
dc.description.refereedTRUE
dc.description.statuspub
dc.eprint.idhttps://eprints.ucm.es/id/eprint/26817
dc.identifier.doi10.1557/PROC-406-537
dc.identifier.isbn1-55899-309-6
dc.identifier.officialurlhttp://dx.doi.org/10.1557/PROC-406-537
dc.identifier.relatedurlhttp://journals.cambridge.org
dc.identifier.urihttps://hdl.handle.net/20.500.14352/60858
dc.issue.number406
dc.page.final542
dc.page.initial537
dc.page.total6
dc.publisherMaterials Research Soc
dc.relation.ispartofseriesMRS Online Proceedings Library
dc.rights.accessRightsmetadata only access
dc.subject.cdu538.9
dc.subject.keywordMaterials Science
dc.subject.keywordCharacterization & Testing
dc.subject.ucmFísica de materiales
dc.titleCathodoluminescence spectroscopy for evaluation of defect passivation in GaSb
dc.typebook part
dc.volume.numberII
dspace.entity.typePublication
relation.isAuthorOfPublication68dabfe9-5aec-4207-bf8a-0851f2e37e2c
relation.isAuthorOfPublication.latestForDiscovery68dabfe9-5aec-4207-bf8a-0851f2e37e2c

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