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Zero reference signal for displacement measuring systems by use of speckle

dc.contributor.authorPérez Quintián, Fernando
dc.contributor.authorAlonso Fernández, José
dc.contributor.authorAtencia Carrizo, Jesús
dc.contributor.authorBernabeu Martínez, Eusebio
dc.date.accessioned2023-06-20T10:46:48Z
dc.date.available2023-06-20T10:46:48Z
dc.date.issued2003-12-01
dc.description© 2003 Optical Society of America. We thank M. Quintanilla for useful comments and discussions. This research has been supported by projects DPI 2001-1238 and DPI 2001-1369 of the Spanish Ministry for Science and Technology.
dc.description.abstractAn optical method for generating a reference signal for an incremental displacement measurement system is proposed. We achieved this zero reference signal by comparing two speckle patterns arriving from two symmetric diffusers, which are used as natural random codes that are identical only when the reading head is located equidistantly between the diffusers. The comparison of the speckles is obtained either by interference, as in a Michelson interferometer, or by intensity correlations.
dc.description.departmentDepto. de Óptica
dc.description.facultyFac. de Ciencias Físicas
dc.description.refereedTRUE
dc.description.sponsorshipMinisterio de Ciencia y Tecnología (MCYT), España
dc.description.statuspub
dc.eprint.idhttps://eprints.ucm.es/id/eprint/26761
dc.identifier.doi10.1364/AO.42.006797
dc.identifier.issn1559-128X
dc.identifier.officialurlhttp://dx.doi.org/10.1364/AO.42.006797
dc.identifier.relatedurlhttp://www.opticsinfobase.org
dc.identifier.urihttps://hdl.handle.net/20.500.14352/51207
dc.issue.number34
dc.journal.titleApplied Optics
dc.language.isoeng
dc.page.final6803
dc.page.initial6797
dc.publisherThe Optical Society Of America
dc.relation.projectIDDPI 2001-1238
dc.relation.projectIDDPI2001-1369
dc.rights.accessRightsopen access
dc.subject.cdu535
dc.subject.keywordReflection
dc.subject.keywordEncoder
dc.subject.ucmÓptica (Física)
dc.subject.unesco2209.19 Óptica Física
dc.titleZero reference signal for displacement measuring systems by use of speckle
dc.typejournal article
dc.volume.number42
dcterms.references1. Y. Arai, T. Kurata, “A high-resolution encoder by multiplication of moire fringes,” Eng. Technol. 9, 1–7 (1987). 2. K. Engelhardt, P. Seitz, “High resolution optical position encoder with large mounting tolerances,” Appl. Opt. 36, 2912–2916 (1997). 3. Y. Wei-Hung, W. Bletscher, M. Mansuripur, “High resolution optical shaft encoder for motor speed control based on an optical disk pick-up,” Rev. Sci. Instrum. 69, 3068–3071 (1998). 4. D. Crespo, J. Alonso, T. Morlanes, E. Bernabéu, “Optical encoder based on the Lau effect,” Opt. Eng. 39, 817–824 (2000). 5. Y. Jourlin, J. Jay, O. Parriaux, “Compact diffractive interferometric displacement sensor in reflection,” Precis. Eng. 26, 1–6 (2002). 6. X. Yang, C. Yin, “A new method for the design of zero reference marks for grating measurement systems,” J. Phys. E. 19, 34–37 (1986). 7. L. Yajun, “Design of zero reference marks for grating measurement systems: a new method,” Meas. Sci. Technol. 1, 848–851 (1990). 8. J. W. Goodman. “Statistical properties of laser speckle patterns,” in Laser Speckle and Related Phenomena, J. C. Dainty, ed., Vol. 9 of Topics in Applied Physics (Springer-Verlag, Berlin, 1984). pp. 9–75 9. R. E. Luna, E. R. Méndez, J. Q. Lu, Z.-H. Gu, “Enhanced backscattering due to total internal reflection at a dielectric-air interface,” J. Mod. Opt. 42, 257–269 (1995). 10. I. Yamaguchi, “Linear and rotary encoders using electronic speckle correlation,” Opt. Eng. 30, 1862–1868 (1991).
dspace.entity.typePublication
relation.isAuthorOfPublicationf7b5b178-742c-418d-80d3-769a169f6dd9
relation.isAuthorOfPublication.latestForDiscoveryf7b5b178-742c-418d-80d3-769a169f6dd9

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