Electron Doping by Charge Transfer at LaFeO_3 /Sm_2CuO_4 Epitaxial Interfaces

Citation

Bruno, F.Y., Schmidt, R., Varela, M., Garcia‐Barriocanal, J., Rivera‐Calzada, A., Cuellar, F.A., Leon, C., Thakur, P., Cezar, J.C., Brookes, N.B., Garcia‐Hernandez, M., Dagotto, E., Pennycook, S.J., Santamaria, J.: Electron Doping by Charge Transfer at LaFeO 3 /Sm 2 CuO 4 Epitaxial Interfaces. Advanced Materials. 25, 1468-1473 (2013). https://doi.org/10.1002/adma.201203483

Abstract

Using X-ray absorption spectroscopy and electron energy loss spectroscopy with atomic-scale spatial resolution, experimental evidence for charge transfer at the interface between the Mott insulators Sm2CuO4 and LaFeO3 is obtained. As a consequence of the charge transfer, the Sm2CuO4 is doped with electrons and thus epitaxial Sm2CuO4/LaFeO3 heterostructures become metallic.

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