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‘‘Charge Leakage’’ at LaMnO_3/SrTiO_3 Interfaces

Citation

Garcia‐Barriocanal, J., Bruno, F.Y., Rivera‐Calzada, A., Sefrioui, Z., Nemes, N.M., Garcia‐Hernández, M., Rubio‐Zuazo, J., Castro, G.R., Varela, M., Pennycook, S.J., Leon, C., Santamaria, J.: “Charge Leakage” at LaMnO 3 /SrTiO 3 Interfaces. Advanced Materials. 22, 627-632 (2010). https://doi.org/10.1002/adma.200902263

Abstract

Direct evidence for charge leakage at the interface of epitaxial SrTiO3/LaMnO3 superlattices with atomically sharp interfaces is provided. The direction of charge leakage can be reversed by changing the LMO/STO thickness ratio. This result will be important for the understanding of some of the reported limitations of oxide devices involving manganite/titanate interfaces.

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