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Proceedings to the 9th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors (BIAMS 2008) held in Toledo, Spain, 29 June-3 July, 2008. Preface

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dc.contributor.authorPiqueras De Noriega, Francisco Javier
dc.contributor.authorCremades Rodríguez, Ana Isabel
dc.contributor.authorFernández Sánchez, Paloma
dc.contributor.authorMéndez Martín, María Bianchi
dc.date.accessioned2023-06-20T03:35:47Z
dc.date.available2023-06-20T03:35:47Z
dc.date.issued2009-04
dc.description©2008 Elsevier Ltd.
dc.description.departmentDepto. de Física de Materiales
dc.description.facultyFac. de Ciencias Físicas
dc.description.refereedTRUE
dc.description.statuspub
dc.eprint.idhttps://eprints.ucm.es/id/eprint/23029
dc.identifier.doi10.1016/j.spmi.2008.11.016
dc.identifier.issn0749-6036
dc.identifier.officialurlhttp://www.sciencedirect.com/science/journal/07496036/45/4-5
dc.identifier.relatedurlhttp://www.sciencedirect.com
dc.identifier.urihttps://hdl.handle.net/20.500.14352/43994
dc.issue.number4 May.
dc.journal.titleSuperlattices and Microstructures
dc.language.isoeng
dc.page.final143
dc.page.initial143
dc.publisherAcademic Press Ltd- Elsevier Science Ltd
dc.rights.accessRightsrestricted access
dc.subject.cdu538.9
dc.subject.keywordRay Photoelectron-Spectroscopy
dc.subject.keywordIn2o3
dc.subject.keywordOxidation
dc.subject.keywordDevices
dc.subject.ucmFísica de materiales
dc.titleProceedings to the 9th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors (BIAMS 2008) held in Toledo, Spain, 29 June-3 July, 2008. Preface
dc.typejournal article
dc.volume.number45
dspace.entity.typePublication
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