Para depositar en Docta Complutense, identifícate con tu correo @ucm.es en el SSO institucional. Haz clic en el desplegable de INICIO DE SESIÓN situado en la parte superior derecha de la pantalla. Introduce tu correo electrónico y tu contraseña de la UCM y haz clic en el botón MI CUENTA UCM, no autenticación con contraseña.

FeB and CrB pair reassociation kinetics in imperfect Si controlled by contactless lifetime scan maps

Thumbnail Image

Official URL

http://dx.doi.org/10.1051/epjap:2004048

Full text at PDC

Publication date

2004

Authors

Advisors (or tutors)

Editors

Journal Title

Journal ISSN

Volume Title

Publisher

E D P Sciences
Citations
Google Scholar
Exportar
DC QDC MarcXML RDF MODS METS ORE-ATOM

URI

https://hdl.handle.net/20.500.14352/51059

Citation

Abstract

The kinetics of "metal-acceptor" pairing in boron-doped multicrystalline samples are investigated by means of contactless lifetime measurement. The case of FeB and CrB pairs is discussed and the influence of extended defect is evidenced for FeB. It is found that the reassociation of the "metal-acceptor" pairs is fast immediately after the dissociation and then slows down for several days. The results allow the identification of mixed contamination by Cr and Fe.

Research Projects

Organizational Units

Journal Issue

Description

© E D P Sciences. International Conference on Defects - Recognition, Imaging and Physics in Semiconductors (DRIP 10) (10. 2003. Batz sur Mer, Francia)

UCM subjects

Física de materiales

Unesco subjects

Keywords

Collections

Artículos