Optoelectronic device for the measurement of the absolute linear position in the micrometric displacement range

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dc.book.titleMaterials, Devices, and Applications
dc.contributor.authorMorlanes Calvo, Tomás
dc.contributor.authorPeña, José Luis de la
dc.contributor.authorSánchez Brea, Luis Miguel
dc.contributor.authorAlonso Fernández, José
dc.contributor.authorCrespo Vázquez, Daniel
dc.contributor.authorSaez Landete, José
dc.contributor.authorBernabeu Martínez, Eusebio
dc.contributor.editorBadenes, Goncal
dc.contributor.editorAbbott, Derek
dc.contributor.editorSerpenguzel, Ali
dc.date.accessioned2023-06-20T13:41:15Z
dc.date.available2023-06-20T13:41:15Z
dc.date.issued2005
dc.description© (2005) SPIE--The International Society for Optical Engineering. Conference on Photonic Materials, Devices and Applications (2005. Sevilla, España)
dc.description.abstractIn this work, an optoelectronic device that provides the absolute position of a measurement element with respect to a pattern scale upon switch-on is presented. That means that there is not a need to perform any kind of transversal displacement after the startup of the system. The optoelectronic device is based on the process of light propagation passing through a slit. A light source with a definite size guarantees the relation of distances between the different elements that constitute our system and allows getting a particular optical intensity profile that can be measured by an electronic post-processing device providing the absolute location of the system with a resolution of 1 micron. The accuracy of this measuring device is restricted to the same limitations of any incremental position optical encoder.
dc.description.departmentDepto. de Óptica
dc.description.facultyFac. de Ciencias Físicas
dc.description.refereedTRUE
dc.description.statuspub
dc.eprint.idhttps://eprints.ucm.es/id/eprint/26744
dc.identifier.doi10.1117/12.628135
dc.identifier.isbn0-8194-5835-X
dc.identifier.officialurlhttp://dx.doi.org/10.1117/12.628135
dc.identifier.relatedurlhttp://proceedings.spiedigitallibrary.org
dc.identifier.urihttps://hdl.handle.net/20.500.14352/53384
dc.issue.number5840
dc.page.final870
dc.page.initial862
dc.publisherSociety of Photo-Optical Instrumentation Engineers (SPIE)
dc.relation.ispartofseriesProceedings of Society of Photo-Optical Instrumentation Engineers (SPIE)
dc.rights.accessRightsmetadata only access
dc.subject.cdu535
dc.subject.keywordLAU
dc.subject.keywordEncoder
dc.subject.ucmÓptica (Física)
dc.subject.unesco2209.19 Óptica Física
dc.titleOptoelectronic device for the measurement of the absolute linear position in the micrometric displacement range
dc.typebook part
dc.volume.number1-2
dspace.entity.typePublication
relation.isAuthorOfPublication72f8db7f-8a25-4d15-9162-486b0f884481
relation.isAuthorOfPublicationf7b5b178-742c-418d-80d3-769a169f6dd9
relation.isAuthorOfPublication.latestForDiscovery72f8db7f-8a25-4d15-9162-486b0f884481
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