Optoelectronic device for the measurement of the absolute linear position in the micrometric displacement range
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2005
Authors
Morlanes Calvo, Tomás
Peña, José Luis de la
Crespo Vázquez, Daniel
Saez Landete, José
Bernabeu Martínez, Eusebio
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Society of Photo-Optical Instrumentation Engineers (SPIE)
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Abstract
In this work, an optoelectronic device that provides the absolute position of a measurement element with respect to a pattern scale upon switch-on is presented. That means that there is not a need to perform any kind of transversal displacement after the startup of the system. The optoelectronic device is based on the process of light propagation passing through a slit. A light source with a definite size guarantees the relation of distances between the different elements that constitute our system and allows getting a particular optical intensity profile that can be measured by an electronic post-processing device providing the absolute location of the system with a resolution of 1 micron. The accuracy of this measuring device is restricted to the same limitations of any incremental position optical encoder.
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© (2005) SPIE--The International Society for Optical Engineering.
Conference on Photonic Materials, Devices and Applications (2005. Sevilla, España)