Study of point defects in CdTe and CdTe:V by cathodoluminescence
dc.contributor.author | Pal, U. | |
dc.contributor.author | Piqueras De Noriega, Francisco Javier | |
dc.contributor.author | Fernández Sánchez, Paloma | |
dc.contributor.author | Serrano, M. D. | |
dc.contributor.author | Diéguez, E. | |
dc.date.accessioned | 2023-06-20T19:07:17Z | |
dc.date.available | 2023-06-20T19:07:17Z | |
dc.date.issued | 1994-09-15 | |
dc.description | © 1994 American Institute of Physics. U. Pal thanks MEC for a post-doctoral research grant. This work has been supported by DGICYT (Project PB 90-1017). | |
dc.description.abstract | Cathodoluminescence in the scanning electron microscope has been used to investigate the relationship of point defects in CdTe and CdTe:V with luminescence bands at 1.40 and 1.13 eV. V has been found to inhibit the 1.40 eV luminescence. Annealing experiments indicate that Cd and Te vacancies are involved in the mentioned emission bands. | |
dc.description.department | Depto. de Física de Materiales | |
dc.description.faculty | Fac. de Ciencias Físicas | |
dc.description.refereed | TRUE | |
dc.description.sponsorship | DGICYT | |
dc.description.status | pub | |
dc.eprint.id | https://eprints.ucm.es/id/eprint/26974 | |
dc.identifier.doi | 10.1063/1.357442 | |
dc.identifier.issn | 0021-8979 | |
dc.identifier.officialurl | http://dx.doi.org/10.1063/1.357442 | |
dc.identifier.relatedurl | http://scitation.aip.org | |
dc.identifier.uri | https://hdl.handle.net/20.500.14352/59271 | |
dc.issue.number | 6 | |
dc.journal.title | Journal of Applied Physics | |
dc.language.iso | eng | |
dc.page.final | 3723 | |
dc.page.initial | 3720 | |
dc.publisher | American Institute of Physics | |
dc.relation.projectID | PB 90-1017 | |
dc.rights.accessRights | open access | |
dc.subject.cdu | 538.9 | |
dc.subject.keyword | Physics | |
dc.subject.keyword | Applied | |
dc.subject.ucm | Física de materiales | |
dc.title | Study of point defects in CdTe and CdTe:V by cathodoluminescence | |
dc.type | journal article | |
dc.volume.number | 76 | |
dcterms.references | 1. T. H. Myers, J. E Schetzina, S. T. Edwards, and A. F. Schrein, J. Appl. Phys. 54, 4232 (1983). 2. L. 0. Bubulac, J. Bajaj, W. E. Termant, P. R. Newman, and D. S. Lo, J. Cryst. Growth 86, 536 (1988). 3. H. L. Cotal, A. C. Lcwandowski, B. G. Markey, S. W. S. McKeever, B. Cantrell, and J. Aldridge, J. Appl. Phys. 67, 975 (1990). 4. U. Pal, P Fernández, J. Piqueras, M. D. Serrano, and E. Diéguez, Inst. Phys. Conf. Ser. 135, 177 (1993). 5. D. M. Hoffmann, P. Omling, H. G. Grimmeiss, B. K. Meyer, K. W. Benz, and D. Sinerius, Phys. Rev. B 45, 6247 (1992). 6. D. M. Hoffmann, W. Stadler, K. Oettinger, B. K. Meyer, P. Omling; M. Salk, K. W. Benz, E Wiegel, and G. Miiller-Vogt, Mater. Sci. Eng. B, 16, 128 (1993). 7. F. J. Bryant and E. Webster, Phys. Status Solidi 21, 315 (1967). 8. P. A. Slodowy and J. M. Baramonski, Phys. Status Solidi B 49, 499 (1972). 9. F. Domínguez-Adame, J. Piqueras, and P. Fernández, Appl. Phys. Lett. 58, 257 (1991). 10. N. E. Korsanskaya, U. V. Markevich, and M. K. Sheinkman, J. Cryst. Growth 101, 285 (1990). 11. J. P. Chamonal, E. Molva, M. Dupuy, R. Accomo, and J. L. Pautrat, Physica B 116,519 (1983). | |
dspace.entity.type | Publication | |
relation.isAuthorOfPublication | 68dabfe9-5aec-4207-bf8a-0851f2e37e2c | |
relation.isAuthorOfPublication | daf4b879-c4a8-4121-aaff-e6ba47195545 | |
relation.isAuthorOfPublication.latestForDiscovery | daf4b879-c4a8-4121-aaff-e6ba47195545 |
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