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Study of point defects in CdTe and CdTe:V by cathodoluminescence

dc.contributor.authorPal, U.
dc.contributor.authorPiqueras De Noriega, Francisco Javier
dc.contributor.authorFernández Sánchez, Paloma
dc.contributor.authorSerrano, M. D.
dc.contributor.authorDiéguez, E.
dc.date.accessioned2023-06-20T19:07:17Z
dc.date.available2023-06-20T19:07:17Z
dc.date.issued1994-09-15
dc.description© 1994 American Institute of Physics. U. Pal thanks MEC for a post-doctoral research grant. This work has been supported by DGICYT (Project PB 90-1017).
dc.description.abstractCathodoluminescence in the scanning electron microscope has been used to investigate the relationship of point defects in CdTe and CdTe:V with luminescence bands at 1.40 and 1.13 eV. V has been found to inhibit the 1.40 eV luminescence. Annealing experiments indicate that Cd and Te vacancies are involved in the mentioned emission bands.
dc.description.departmentDepto. de Física de Materiales
dc.description.facultyFac. de Ciencias Físicas
dc.description.refereedTRUE
dc.description.sponsorshipDGICYT
dc.description.statuspub
dc.eprint.idhttps://eprints.ucm.es/id/eprint/26974
dc.identifier.doi10.1063/1.357442
dc.identifier.issn0021-8979
dc.identifier.officialurlhttp://dx.doi.org/10.1063/1.357442
dc.identifier.relatedurlhttp://scitation.aip.org
dc.identifier.urihttps://hdl.handle.net/20.500.14352/59271
dc.issue.number6
dc.journal.titleJournal of Applied Physics
dc.language.isoeng
dc.page.final3723
dc.page.initial3720
dc.publisherAmerican Institute of Physics
dc.relation.projectIDPB 90-1017
dc.rights.accessRightsopen access
dc.subject.cdu538.9
dc.subject.keywordPhysics
dc.subject.keywordApplied
dc.subject.ucmFísica de materiales
dc.titleStudy of point defects in CdTe and CdTe:V by cathodoluminescence
dc.typejournal article
dc.volume.number76
dcterms.references1. T. H. Myers, J. E Schetzina, S. T. Edwards, and A. F. Schrein, J. Appl. Phys. 54, 4232 (1983). 2. L. 0. Bubulac, J. Bajaj, W. E. Termant, P. R. Newman, and D. S. Lo, J. Cryst. Growth 86, 536 (1988). 3. H. L. Cotal, A. C. Lcwandowski, B. G. Markey, S. W. S. McKeever, B. Cantrell, and J. Aldridge, J. Appl. Phys. 67, 975 (1990). 4. U. Pal, P Fernández, J. Piqueras, M. D. Serrano, and E. Diéguez, Inst. Phys. Conf. Ser. 135, 177 (1993). 5. D. M. Hoffmann, P. Omling, H. G. Grimmeiss, B. K. Meyer, K. W. Benz, and D. Sinerius, Phys. Rev. B 45, 6247 (1992). 6. D. M. Hoffmann, W. Stadler, K. Oettinger, B. K. Meyer, P. Omling; M. Salk, K. W. Benz, E Wiegel, and G. Miiller-Vogt, Mater. Sci. Eng. B, 16, 128 (1993). 7. F. J. Bryant and E. Webster, Phys. Status Solidi 21, 315 (1967). 8. P. A. Slodowy and J. M. Baramonski, Phys. Status Solidi B 49, 499 (1972). 9. F. Domínguez-Adame, J. Piqueras, and P. Fernández, Appl. Phys. Lett. 58, 257 (1991). 10. N. E. Korsanskaya, U. V. Markevich, and M. K. Sheinkman, J. Cryst. Growth 101, 285 (1990). 11. J. P. Chamonal, E. Molva, M. Dupuy, R. Accomo, and J. L. Pautrat, Physica B 116,519 (1983).
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