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Study of point defects in CdTe and CdTe:V by cathodoluminescence

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http://dx.doi.org/10.1063/1.357442

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1994

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American Institute of Physics
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https://hdl.handle.net/20.500.14352/59271

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Abstract

Cathodoluminescence in the scanning electron microscope has been used to investigate the relationship of point defects in CdTe and CdTe:V with luminescence bands at 1.40 and 1.13 eV. V has been found to inhibit the 1.40 eV luminescence. Annealing experiments indicate that Cd and Te vacancies are involved in the mentioned emission bands.

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© 1994 American Institute of Physics. U. Pal thanks MEC for a post-doctoral research grant. This work has been supported by DGICYT (Project PB 90-1017).

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