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Local distribution of deep centers in GaP studied by infrared cathodoluminescence

dc.contributor.authorDomínguez-Adame Acosta, Francisco
dc.contributor.authorPiqueras De Noriega, Francisco Javier
dc.contributor.authorFernández Sánchez, Paloma
dc.date.accessioned2023-06-20T19:07:58Z
dc.date.available2023-06-20T19:07:58Z
dc.date.issued1991-01-21
dc.description© 1991 American Institute of Physics. This work was supported by the Comisibn Interministerial de Ciencia y Tecnologia (Project PB86-0151) . The authors thank Wacker-Chemitronic (Dr. K. Liihnert) for providing the samples and Dr. P. Moser (C.E.N.G.Grenoble) for the electron irradiation.
dc.description.abstractNear-infrared cathodoluminescence (CL) in the scanning electron microscope has been used to characterize GaP:S. Spectra of as-grown crystals show a broadband at about 1240 nm, probably related to P(Ga) antisite defects. This emission has been found to be higher at dislocations giving a CL image opposite to the visible CL image.
dc.description.departmentDepto. de Física de Materiales
dc.description.facultyFac. de Ciencias Físicas
dc.description.refereedTRUE
dc.description.sponsorshipComisión Interministerial de Ciencia y Tecnologia
dc.description.statuspub
dc.eprint.idhttps://eprints.ucm.es/id/eprint/27035
dc.identifier.doi10.1063/1.104681
dc.identifier.issn0003-6951
dc.identifier.officialurlhttp://dx.doi.org/10.1063/1.104681
dc.identifier.relatedurlhttp://scitation.aip.org
dc.identifier.urihttps://hdl.handle.net/20.500.14352/59289
dc.issue.number3
dc.journal.titleApplied physics Letters
dc.language.isoeng
dc.page.final259
dc.page.initial257
dc.publisherAmer Inst Physics
dc.relation.projectIDProject PB86-0151
dc.rights.accessRightsopen access
dc.subject.cdu538.9
dc.subject.keywordVacancy Defects
dc.subject.ucmFísica de materiales
dc.titleLocal distribution of deep centers in GaP studied by infrared cathodoluminescence
dc.typejournal article
dc.volume.number58
dcterms.references1. N. Killoran, B. C. Cavenett, M. Godlewski, T. A. Kennedy, and N. D. Wilsey, J. Phys. C 15, L723 (1982). 2. X. Z. Yang, L. Samuelson, H. G. Grimmeiss, and P. Omling, Sem dond. Sci. Technol. 3, 488 (1988). 3. M. Godlewski and B. Monemar, J. Appl. Phys. 64, 200 (1988). 4. K. Chino, T. Kazuno, K. Satoh, and M. Kubota, in Semi-Znsuluting III-V Materials (Adam Hilger, England, 1988), p. 133. 5. F. Domínguez-Adame, J. Piqueras, N. de Diego, and J. Llopis, J. Appl. Phys. 63, 2583 (1988). 6. F. Domínguez-Adame, J. Piqueras, N. de Diego, and P. Moser, Solid State Commun. 67, 665 (1988). 7. F. Domínguez-Adame and J. Piqueras, Mater. Chem. Phys. 21, 539 (1989). 8. E. R. Weber, H. Ennen, U. Kaufmann, J. Windscheif, J. Schneider, and T. Wosinski, J. Appl. Phys. 53, 6140 (1982). 9. A. R. Peaker, B. Halmilton, D. R. Wight, D. Blenkinsop, W. Harding, and R. Gibb, Inst. Phys. Conf. Ser. No. 33a, 326 (1977).
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