In-line detection and evaluation of surface defects on thin metallic wires

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dc.book.titleOptical Measurement Systems for Industrial Inspection II: Applications in Production Engineeringen
dc.contributor.authorMartínez Antón, Juan Carlos
dc.contributor.authorSiegmann, Philip
dc.contributor.authorSánchez Brea, Luis Miguel
dc.contributor.authorGómez Pedrero, José Antonio
dc.contributor.authorCanabal Boutureira, Héctor Alfonso
dc.contributor.authorBernabéu Martínez, Eusebio
dc.contributor.editorHoefling, Roland
dc.contributor.editorJueptner, Werner P. O.
dc.contributor.editorKujawinska, Malgorzata
dc.date.accessioned2023-06-20T21:09:45Z
dc.date.available2023-06-20T21:09:45Z
dc.date.copyright© SPIE--The International Society for Optical Engineering. Conference on Optical Measurement Systems for Industrial Inspection II (2ª. 2001. Múnich, Alemania).
dc.date.issued2001
dc.description.abstractWe have developed a prototype for in-line detection of surface defects in metallic wires, specially for scratches. A simple geometrical relationship between surface topography and conical reflection, permits to correlate the defects with intensity patterns in a simple way. The presented apparatus consists basically in a grating-divided laser beam incident on angular equidistant points. A CCD and an associated optics capture the information of the whole wire perimeter at once. Analytic rudiments are provided in agreement with the experimental results.en
dc.description.departmentDepto. de Óptica
dc.description.facultyFac. de Ciencias Físicas
dc.description.refereedTRUE
dc.description.statuspub
dc.eprint.idhttps://eprints.ucm.es/id/eprint/26795
dc.identifier.citationMartinez Anton, J. C., Siegmann, P., Sánchez Brea, L. M. et al. «In-line detection and evaluation of surface defects on thin metallic wires». Optical Measurement Systems for Industrial Inspection II: Applications in Production Engineering, vol. 4399, SPIE, 2001, pp. 27-34. www.spiedigitallibrary.org, https://doi.org/10.1117/12.445586.
dc.identifier.doi10.1117/12.445586
dc.identifier.isbn0-8194-4094-9
dc.identifier.officialurlhttp://dx.doi.org/10.1117/12.445586
dc.identifier.relatedurlhttp://proceedings.spiedigitallibrary.org
dc.identifier.urihttps://hdl.handle.net/20.500.14352/60856
dc.issue.number4399
dc.page.final34
dc.page.initial27
dc.publisherThe International Society for Optical Engineering (SPIE)
dc.relation.ispartofseriesProceedings of The Society Of Photo-Optical Instrumentation Engineers (SPIE)
dc.rights.accessRightsmetadata only access
dc.subject.cdu535
dc.subject.keywordQuality Control
dc.subject.keywordWire
dc.subject.keywordConical Reflection
dc.subject.ucmÓptica (Física)
dc.subject.unesco2209.19 Óptica Física
dc.titleIn-line detection and evaluation of surface defects on thin metallic wires
dc.typebook part
dspace.entity.typePublication
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relation.isAuthorOfPublication.latestForDiscovery1baf6769-50bc-4dcd-9479-8de2d65eec19
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