In-line detection and evaluation of surface defects on thin metallic wires

Martínez Antón, Juan Carlos; Siegmann, Philip; Sánchez Brea, Luis Miguel; Gómez Pedrero, José Antonio; Canabal Boutureira, Héctor Alfonso; Bernabéu Martínez, Eusebio

In-line detection and evaluation of surface defects on thin metallic wires

Official URL

http://dx.doi.org/10.1117/12.445586

Publication date

2001

Authors

Martínez Antón, Juan Carlos

Siegmann, Philip

Sánchez Brea, Luis Miguel

Gómez Pedrero, José Antonio

Canabal Boutureira, Héctor Alfonso

Bernabéu Martínez, Eusebio

Editors

Hoefling, Roland

Jueptner, Werner P. O.

Kujawinska, Malgorzata

Publisher

The International Society for Optical Engineering (SPIE)

Citations

Exportar

URI

https://hdl.handle.net/20.500.14352/60856

Citation

Martinez Anton, J. C., Siegmann, P., Sánchez Brea, L. M. et al. «In-line detection and evaluation of surface defects on thin metallic wires». Optical Measurement Systems for Industrial Inspection II: Applications in Production Engineering, vol. 4399, SPIE, 2001, pp. 27-34. www.spiedigitallibrary.org, https://doi.org/10.1117/12.445586.

Abstract

We have developed a prototype for in-line detection of surface defects in metallic wires, specially for scratches. A simple geometrical relationship between surface topography and conical reflection, permits to correlate the defects with intensity patterns in a simple way. The presented apparatus consists basically in a grating-divided laser beam incident on angular equidistant points. A CCD and an associated optics capture the information of the whole wire perimeter at once. Analytic rudiments are provided in agreement with the experimental results.