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In-line detection and evaluation of surface defects on thin metallic wires

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2001

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The International Society for Optical Engineering (SPIE)
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Martinez Anton, J. C., Siegmann, P., Sánchez Brea, L. M. et al. «In-line detection and evaluation of surface defects on thin metallic wires». Optical Measurement Systems for Industrial Inspection II: Applications in Production Engineering, vol. 4399, SPIE, 2001, pp. 27-34. www.spiedigitallibrary.org, https://doi.org/10.1117/12.445586.

Abstract

We have developed a prototype for in-line detection of surface defects in metallic wires, specially for scratches. A simple geometrical relationship between surface topography and conical reflection, permits to correlate the defects with intensity patterns in a simple way. The presented apparatus consists basically in a grating-divided laser beam incident on angular equidistant points. A CCD and an associated optics capture the information of the whole wire perimeter at once. Analytic rudiments are provided in agreement with the experimental results.

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