Ellipsometric characterization of Bi and Al2O3 coatings for plasmon excitation in an optical fiber sensor

Simple item page
dc.contributor.authorRodriguez Schwendtner, Eva María
dc.contributor.authorÁlvarez Herrero, Alberto
dc.contributor.authorMariscal Jiménez, Antonio
dc.contributor.authorSerna Galán, Rosalía
dc.contributor.authorGonzález Cano, Agustín
dc.contributor.authorNavarrete Fernández, María Cruz
dc.contributor.authorDíaz Herrera, Natalia
dc.date.accessioned2023-06-16T15:15:34Z
dc.date.available2023-06-16T15:15:34Z
dc.date.issued2019-11-01
dc.description.abstractThe authors present the results of the ellipsometric characterization of thin layers of bismuth and aluminum oxide deposited over the waist of a tapered optical fiber by pulsed laser deposition. The characteristics of the deposits are studied by spectroscopic ellipsometry. From the effective thicknesses determined by the ellipsometric characterization, it is shown by simulations that surface plasmon resonances (SPRs) can occur in the fiber device, and it is demonstrated experimentally. These results show the feasibility of employing bismuth as a plasmonic material in SPR fiber sensors based on doubly-deposited uniform-waist tapered optical fibers, which show excellent performance and versatility.
dc.description.departmentSección Deptal. de Óptica (Óptica)
dc.description.facultyFac. de Óptica y Optometría
dc.description.refereedTRUE
dc.description.sponsorshipMinisterio de Ciencia e Innovación (MICINN)/FEDER
dc.description.sponsorshipUniversidad Complutense de Madrid/Banco de Santander
dc.description.statuspub
dc.eprint.idhttps://eprints.ucm.es/id/eprint/58574
dc.identifier.doi10.1116/1.5121590
dc.identifier.issn2166-2746
dc.identifier.officialurlhttp://dx.doi.org/10.1116/1.5121590
dc.identifier.urihttps://hdl.handle.net/20.500.14352/5999
dc.issue.number6
dc.journal.titleJournal of Vacuum Science and Technology B: Nanotechnology and Microelectronics
dc.language.isoeng
dc.page.initial062914
dc.publisherAVS Science and Technology Society; American Vacuum Society
dc.relation.projectIDRTI2018-096498-B-I00
dc.relation.projectIDPR75/18-21568
dc.relation.projectIDBES-2013-062593
dc.rights.accessRightsopen access
dc.subject.cdu533.9
dc.subject.cdu621.391.6
dc.subject.cdu537.52
dc.subject.keywordSurface plasmon resonance
dc.subject.keywordResonance sensor
dc.subject.keywordOptical fibers
dc.subject.keywordSpectroscopic ellipsometry
dc.subject.keywordPulsed laser deposition
dc.subject.ucmFísica de materiales
dc.subject.ucmÓptica (Física)
dc.subject.ucmPartículas
dc.subject.unesco2209.19 Óptica Física
dc.subject.unesco2208 Nucleónica
dc.titleEllipsometric characterization of Bi and Al2O3 coatings for plasmon excitation in an optical fiber sensor
dc.typejournal article
dc.volume.number37
dspace.entity.typePublication
relation.isAuthorOfPublicatione77a30e7-98fe-421b-8010-077246ffcbdf
relation.isAuthorOfPublication8f013df5-4042-4b99-b639-1176bcb4d4ce
relation.isAuthorOfPublicationdcb68811-1dc9-4b0a-9d96-31fe85a121da
relation.isAuthorOfPublicationafe9b8aa-a3ab-4e1c-a223-856d6b12ae4d
relation.isAuthorOfPublication.latestForDiscoverye77a30e7-98fe-421b-8010-077246ffcbdf
Download
Original bundle
Now showing 1 - 1 of 1
Thumbnail Image
Name:
Gonzalez Cano_Ellipsometric characterization.pdf
Size:
2.81 MB
Format:
Adobe Portable Document Format
downoload Download
Collections
Artículos