Ellipsometric characterization of Bi and Al2O3 coatings for plasmon excitation in an optical fiber sensor

Rodriguez Schwendtner, Eva María; Álvarez Herrero, Alberto; Mariscal Jiménez, Antonio; Serna Galán, Rosalía; González Cano, Agustín; Navarrete Fernández, María Cruz; Díaz Herrera, Natalia

Ellipsometric characterization of Bi and Al2O3 coatings for plasmon excitation in an optical fiber sensor

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Gonzalez Cano_Ellipsometric characterization.pdf (2.81 MB)

Official URL

http://dx.doi.org/10.1116/1.5121590

Publication date

2019

Authors

Rodriguez Schwendtner, Eva María

Álvarez Herrero, Alberto

Mariscal Jiménez, Antonio

Serna Galán, Rosalía

González Cano, Agustín

Navarrete Fernández, María Cruz

Díaz Herrera, Natalia

Publisher

AVS Science and Technology Society; American Vacuum Society

Citations

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URI

https://hdl.handle.net/20.500.14352/5999

Abstract

The authors present the results of the ellipsometric characterization of thin layers of bismuth and aluminum oxide deposited over the waist of a tapered optical fiber by pulsed laser deposition. The characteristics of the deposits are studied by spectroscopic ellipsometry. From the effective thicknesses determined by the ellipsometric characterization, it is shown by simulations that surface plasmon resonances (SPRs) can occur in the fiber device, and it is demonstrated experimentally. These results show the feasibility of employing bismuth as a plasmonic material in SPR fiber sensors based on doubly-deposited uniform-waist tapered optical fibers, which show excellent performance and versatility.