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Frequency analysis of the dielectric constant of YBa2Cu3O7 Josephson junctions fabricated on bicrystalline substrates

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dc.contributor.authorLucía Mulas, María Luisa
dc.contributor.authorSánchez Quesada, Francisco
dc.date.accessioned2023-06-20T10:47:51Z
dc.date.available2023-06-20T10:47:51Z
dc.date.issued2006-07
dc.description© The American Physical Society. This work was supported by the CICYT Grant No. BMF2001-1419, the ESF Network “Phi-shift,” the project DG236RIC “NDA” and the TRN “DeQUACS.”
dc.description.abstractWe have studied the electromagnetic parameters of YBa2Cu3O7 Josephson junctions fabricated on bicrystalline substrates with different angles tilted around the [100] and [001] axis. Changing a technological parameter such as the junction width permits change to the resonant frequency of the barrier cavity. This change in the resonance frequency allows one to determine a frequency dependent dispersion relation of the dielectric constant epsilon(omega). We have explored the proximity to a resonance in the dielectric response and analyzed its resonance frequency and damping constant. In terms of a RLC circuital equivalence additional information on the inductive response is presented as a comparative study of junctions fabricated on substrates with different bicrystalline misorientations.
dc.description.departmentDepto. de Estructura de la Materia, Física Térmica y Electrónica
dc.description.facultyFac. de Ciencias Físicas
dc.description.refereedTRUE
dc.description.sponsorshipCICYT
dc.description.sponsorshipESF Network “Phi-shift”
dc.description.statuspub
dc.eprint.idhttps://eprints.ucm.es/id/eprint/27332
dc.identifier.doi10.1103/PhysRevB.74.024507
dc.identifier.issn1098-0121
dc.identifier.officialurlhttp://dx.doi.org/10.1103/PhysRevB.74.024507
dc.identifier.relatedurlhttp://journals.aps.org/
dc.identifier.urihttps://hdl.handle.net/20.500.14352/51240
dc.issue.number2
dc.journal.titlePhysical Review B
dc.language.isoeng
dc.publisherAmerican Physical Society
dc.relation.projectIDBMF2001-1419
dc.relation.projectIDDG236RIC "NDA"
dc.relation.projectIDTRN “DeQUACS”
dc.rights.accessRightsopen access
dc.subject.cdu537
dc.subject.keywordGrain-Boundary Junctions
dc.subject.keywordElectromagnetic Properties
dc.subject.keywordHe+ Irradiation
dc.subject.keywordICRN-Prodcuts
dc.subject.keywordSuperconductors
dc.subject.keywordInterface
dc.subject.keywordTransport.
dc.subject.ucmElectricidad
dc.subject.ucmElectrónica (Física)
dc.subject.unesco2202.03 Electricidad
dc.titleFrequency analysis of the dielectric constant of YBa2Cu3O7 Josephson junctions fabricated on bicrystalline substrates
dc.typejournal article
dc.volume.number74
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relation.isAuthorOfPublication.latestForDiscovery83f99fc6-abdc-4870-9040-a54cfb6fd5bf

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