Frequency analysis of the dielectric constant of YBa2Cu3O7 Josephson junctions fabricated on bicrystalline substrates

Abstract

We have studied the electromagnetic parameters of YBa2Cu3O7 Josephson junctions fabricated on bicrystalline substrates with different angles tilted around the [100] and [001] axis. Changing a technological parameter such as the junction width permits change to the resonant frequency of the barrier cavity. This change in the resonance frequency allows one to determine a frequency dependent dispersion relation of the dielectric constant epsilon(omega). We have explored the proximity to a resonance in the dielectric response and analyzed its resonance frequency and damping constant. In terms of a RLC circuital equivalence additional information on the inductive response is presented as a comparative study of junctions fabricated on substrates with different bicrystalline misorientations.