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CEPRAM: Compression for Endurance in PCM RAM

dc.contributor.authorGonzález Alberquilla, Rodrigo
dc.contributor.authorCastro Rodríguez, Fernando
dc.contributor.authorPiñuel Moreno, Luis
dc.contributor.authorTirado Fernández, José Francisco
dc.date.accessioned2023-06-17T22:09:15Z
dc.date.available2023-06-17T22:09:15Z
dc.date.issued2017-04-04
dc.description© World Scientific Publishing Company. This work has been supported by the Spanish government through the research contracts TIN2012-32180 and TIN 2015-65277-R, and the HIPEAC-4 European Network of Excellence.
dc.description.abstractWe deal with the endurance problem of Phase Change Memories (PCM) by proposing Compression for Endurance in PCM RAM (CEPRAM), a technique to elongate the lifespan of PCM-based main memory through compression. We introduce a total of three compression schemes based on already existent schemes, but targeting compression for PCM-based systems. We do a two-level evaluation. First, we quantify the performance of the compression, in terms of compressed size, bit-flips and how they are affected by errors. Next, we simulate these parameters in a statistical simulator to study how they affect the endurance of the system. Our simulation results reveal that our technique, which is built on top of Error Correcting Pointers (ECP) but using a high-performance cache-oriented compression algorithm modified to better suit our purpose, manages to further extend the lifetime of the memory system. In particular, it guarantees that at least half of the physical pages are in usable condition for 25% longer than ECP, which is slightly more than 5% more than a scheme that can correct 16 failures per block.
dc.description.departmentSección Deptal. de Arquitectura de Computadores y Automática (Físicas)
dc.description.facultyFac. de Ciencias Físicas
dc.description.refereedTRUE
dc.description.sponsorshipMinisterio de Ciencia e Innovación (MICINN)
dc.description.sponsorshipHIPEAC-4 European Network of Excellence
dc.description.statuspub
dc.eprint.idhttps://eprints.ucm.es/id/eprint/44962
dc.identifier.doi10.1142/S0218126617501675
dc.identifier.issn0218-1266
dc.identifier.officialurlhttp://dx.doi.org/10.1142/S0218126617501675
dc.identifier.relatedurlhttp://www.worldscientific.com/
dc.identifier.urihttps://hdl.handle.net/20.500.14352/18143
dc.issue.number11
dc.journal.titleJournal of circuits systems and computers
dc.language.isoeng
dc.publisherWorld Scientific Publ co Pte LTD
dc.relation.projectIDTIN2012-32180
dc.relation.projectIDTIN 2015-65277-R
dc.rights.accessRightsopen access
dc.subject.cdu004
dc.subject.keywordPhase change memory
dc.subject.keywordMain memory
dc.subject.keywordCache capacity
dc.subject.keywordTechnology.
dc.subject.ucmInformática (Informática)
dc.subject.ucmProgramación de ordenadores (Informática)
dc.subject.unesco1203.17 Informática
dc.subject.unesco1203.23 Lenguajes de Programación
dc.titleCEPRAM: Compression for Endurance in PCM RAM
dc.typejournal article
dc.volume.number26
dspace.entity.typePublication
relation.isAuthorOfPublication9aac3e41-2993-45aa-b0e1-7bae1dacd982
relation.isAuthorOfPublication2ce782af-0e05-45eb-b58a-d2efffec6785
relation.isAuthorOfPublication1356616c-9e69-4852-8415-62fd0b8e7cfc
relation.isAuthorOfPublication.latestForDiscovery9aac3e41-2993-45aa-b0e1-7bae1dacd982

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