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Uniformity characterization of SI-GaAs by cathodoluminescence and scanning electron acoustic microscopy

dc.book.titleMicroscopy of Semiconducting Materials 1989
dc.contributor.authorMéndez Martín, María Bianchi
dc.contributor.authorPiqueras De Noriega, Francisco Javier
dc.date.accessioned2023-06-20T21:09:14Z
dc.date.available2023-06-20T21:09:14Z
dc.date.issued1989
dc.description© IOP Publishing LTD. Conference on Microscopy of Semiconducting Materials (1989. Oxford)
dc.description.abstractThe capabilities of SEAM in uniformity assessment of SI GaAs are investigated. Profiles of SEAM signals across the wafer and SEAM images of dislocation distribution are obtained. Part of the nonlinear signal shows a profile that is not related to dislocation distribution.
dc.description.departmentDepto. de Física de Materiales
dc.description.facultyFac. de Ciencias Físicas
dc.description.refereedTRUE
dc.description.statuspub
dc.eprint.idhttps://eprints.ucm.es/id/eprint/25128
dc.identifier.isbn0-85498-056-3
dc.identifier.issn0951-3248
dc.identifier.urihttps://hdl.handle.net/20.500.14352/60829
dc.issue.number100
dc.journal.titleInstitute of Physics Conference Series
dc.page.final794
dc.page.initial789
dc.page.total6
dc.publisherIOP Publishing LTD
dc.relation.ispartofseriesInstitute of Physics Conference Series
dc.rights.accessRightsmetadata only access
dc.subject.cdu538.9
dc.subject.keywordLec Gaas
dc.subject.keywordSemiconductors
dc.subject.ucmFísica de materiales
dc.titleUniformity characterization of SI-GaAs by cathodoluminescence and scanning electron acoustic microscopy
dc.typebook part
dspace.entity.typePublication
relation.isAuthorOfPublication465cfd5b-6dd4-4a48-a6e3-160df06f7046
relation.isAuthorOfPublication68dabfe9-5aec-4207-bf8a-0851f2e37e2c
relation.isAuthorOfPublication.latestForDiscovery465cfd5b-6dd4-4a48-a6e3-160df06f7046

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