Power divergence approach for one-shot device testing under competing risks
dc.contributor.author | Balakrishnan, Narayanaswamy | |
dc.contributor.author | Castilla González, Elena María | |
dc.contributor.author | Martín Apaolaza, Nirian | |
dc.contributor.author | Pardo Llorente, Leandro | |
dc.date.accessioned | 2023-06-22T10:57:22Z | |
dc.date.available | 2023-06-22T10:57:22Z | |
dc.date.issued | 2022-08-27 | |
dc.description.abstract | Most work on one-shot devices assume that there is only one possible cause of device failure. However, in practice, it is often the case that the products under study can experience any one of various possible causes of failure. Robust estimators and Wald-type tests are developed here for the case of one-shot devices under competing risks. An extensive simulation study illustrates the robustness of these divergence-based estimators and test procedures based on them. A data-driven procedure is proposed for choosing the optimal estimator for any given data set which is then applied to an example in the context of survival analysis. | |
dc.description.department | Depto. de Economía Financiera y Actuarial y Estadística | |
dc.description.department | Depto. de Estadística e Investigación Operativa | |
dc.description.faculty | Fac. de Ciencias Económicas y Empresariales | |
dc.description.faculty | Fac. de Ciencias Matemáticas | |
dc.description.refereed | TRUE | |
dc.description.sponsorship | Ministerio de Ciencia e Innovación (MICINN) | |
dc.description.status | pub | |
dc.eprint.id | https://eprints.ucm.es/id/eprint/74317 | |
dc.identifier.citation | [1] Balakrishnan, N., So. H., and Ling, M. H. (2016a). A Bayesian approach for one-shot device testing with exponential lifetimes under competing risks. IEEE Transactions on Reliability, 65(1), 469-485. [2] Balakrishnan, N., So. H., and Ling, M. H. (2016b). EM algorithm for one-shot device testing with competing risks under Weibull distribution. IEEE Transactions on Reliability, 65(2), 973-991. [3] Balakrishnan, N., Castilla, E., Martin N. and Pardo, L. (2019a). Robust estimators and test-statistics for one-shot device testing under the exponential distribution. IEEE Transactions on Information Theory, 65(5), 3080-3096. [4] Balakrishnan, N., Castilla, E., Martin N. and Pardo, L. (2019b). Robust estimators for one-shot device testing data under gamma lifetime model with an application to a tumor toxicological data. Metrika, 82(8), 991{1019. [5] Balakrishnan, N., Castilla, E., Martin N. and Pardo, L. (2019c). Robust inference for one-shot device testing data under Weibull lifetime model. IEEE Transactions on Reliability, DOI: 10.1109/TR.2019.2954385. [6] Balakrishnan, N., Castilla, E., Martin N. and Pardo, L. (2020). Robust inference for one-shot device testing data under exponential lifetime model with multiple stresses Under revision [7] Crowder, M. J. (2001). Classical Competing Risks. Chapman and Hall/CRC, Press, London. [8] Ghosh, A. and Basu, A. (2013). Robust estimation for independent non-homogeneous observations using density power divergence with applications to linear regression.Electronic Journal of Statistics, 7, 2420-2456. [9] Ghosh, A. and Basu, A. (2015). Robust estimation for non-homogeneous data and the selection of the optimal tuning parameter: The density power divergence approach. Journal of Applied Statistics, 42, 2056-2072. [10] Hampel, F. R., Ronchetti, E., Rousseeuw, P. J. and Stahel W. (1986). Robust Statistics: The Approach Based on Influence Functions. John Wiley & Sons, New York. [11] Heilbron, D. C. (1994). Zero-altered and other regression models for count data with added zeros. Biometrical Journal, 36, 531-547. [12] Hong, C. and Kim, Y. (2001). Automatic selection of the tuning parameter in the minimum density power divergence estimation. Journal of the Korean Statistical Society, 30, 453-465. [13] Lambert, D. (1992). Zero-inflated Poisson regression, with an application to defects in manufacturing. Technometrics, 34(1), 1-14. [14] Lindsey, J. and Ryan, L. (1993). A three-state multiplicative model for rodent tumorigenicity experiments. Journal of the Royal Statistical Society, Series C, 42, 283-300. [15] So, H. (2006). Some Inferential Results for One-Shot Device Testing Data Analysis. PhD thesis, McMaster University, Canada; http://hdl.handle.net/11375/19438. [16] Warwick, J. (2001). Selecting Tuning Parameters in Minimum Distance Estimators. PhD thesis, The Open University, Milton Keynes, England. [17] Warwick, J. and Jones, M. C. (2005). Choosing a robustness tuning parameter. Jour- nal of Statistical Computation and Simulation, 75, 581-588. | |
dc.identifier.doi | 10.1016/j.cam.2022.114676 | |
dc.identifier.issn | 0377-0427 | |
dc.identifier.officialurl | https://doi.org/10.1016/j.cam.2022.114676 | |
dc.identifier.uri | https://hdl.handle.net/20.500.14352/71936 | |
dc.journal.title | Journal of Computational and Applied Mathematics | |
dc.language.iso | eng | |
dc.publisher | Elsevier | |
dc.relation.projectID | PGC2018-095194- B-I00 | |
dc.rights.accessRights | open access | |
dc.subject.cdu | 519.22 | |
dc.subject.keyword | One-shot devices | |
dc.subject.keyword | Robustness | |
dc.subject.keyword | Reliability | |
dc.subject.keyword | Minimum DPD estimators | |
dc.subject.keyword | Wald-type tests | |
dc.subject.ucm | Estadística matemática (Matemáticas) | |
dc.subject.unesco | 1209 Estadística | |
dc.title | Power divergence approach for one-shot device testing under competing risks | |
dc.type | journal article | |
dc.volume.number | 419 | |
dspace.entity.type | Publication | |
relation.isAuthorOfPublication | 9a67ded0-2436-44f5-bdc9-07033ae6f956 | |
relation.isAuthorOfPublication | 1705b043-bb96-4d44-8e13-1c2238cf1717 | |
relation.isAuthorOfPublication | a6409cba-03ce-4c3b-af08-e673b7b2bf58 | |
relation.isAuthorOfPublication.latestForDiscovery | 9a67ded0-2436-44f5-bdc9-07033ae6f956 |
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