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A portable low-cost SEU evaluation board for SRAMs

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dc.book.title2007 Spanish Conference on Electron Devices, Proceedings
dc.conference.date31/01/2007-02/02/2007
dc.conference.placeSan Lorenzo del Escorial (Spain)
dc.conference.titleElectron Devices, 2007 Spanish Conference on
dc.contributor.authorFranco Peláez, Francisco Javier
dc.contributor.authorVelazco, Raoul
dc.date.accessioned2023-06-20T13:41:42Z
dc.date.available2023-06-20T13:41:42Z
dc.date.issued2007-01-31
dc.description©IEEE. Spanish Conference on Electron Devices (6.2007.Madrid). This work was supported by the NICRON Project (Fault-Tolerant Design and Verification for Safety-Critical Applications built from Advanced Integrated Circuits), in the frame of the ALFA (América Latina Formación Académica) cooperation agreement.
dc.description.abstractThis paper describes a field test system to evaluate the sensitivity of SRAMs to the natural radiation coming from the interaction of cosmic rays with the atmosphere. Unlike other experiments, this system is optimized to be portable and autonomous in order to allow making the development of the tests more flexible.
dc.description.departmentDepto. de Estructura de la Materia, Física Térmica y Electrónica
dc.description.facultyFac. de Ciencias Físicas
dc.description.refereedTRUE
dc.description.statuspub
dc.eprint.idhttps://eprints.ucm.es/id/eprint/29153
dc.identifier.doi10.1109/SCED.2007.384018
dc.identifier.isbn1-4244-0868-7
dc.identifier.officialurlhttp://dx.doi.org/10.1109/SCED.2007.384018
dc.identifier.relatedurlhttp://ieeexplore.ieee.org/
dc.identifier.urihttps://hdl.handle.net/20.500.14352/53413
dc.language.isoeng
dc.page.final168
dc.page.initial165
dc.page.total4
dc.publisherIEEE-Inst Electrical Electronics Engineers Inc
dc.relation.projectIDALFA
dc.relation.projectIDNICRON Project
dc.rights.accessRightsopen access
dc.subject.cdu537.8
dc.subject.keywordSRAM chips
dc.subject.keywordLogic testing
dc.subject.keywordRadiation effects
dc.subject.keywordSensitivity
dc.subject.keywordSEU evaluation board
dc.subject.keywordSRAM
dc.subject.keywordCosmic ray interaction
dc.subject.keywordField test system
dc.subject.keywordNatural radiation effects
dc.subject.keywordSingle event upset
dc.subject.keywordAtmosphere
dc.subject.keywordCosmic rays
dc.subject.keywordField programmable gate arrays
dc.subject.keywordLaboratories
dc.subject.keywordMicroprocessors
dc.subject.keywordNeutrons
dc.subject.keywordPerformance evaluation
dc.subject.keywordRandom access memory
dc.subject.keywordSystem testing
dc.subject.keywordSRAMs
dc.subject.keywordSingle event effects
dc.subject.keywordSoft error rate
dc.subject.ucmElectrónica (Física)
dc.subject.ucmRadiactividad
dc.subject.ucmCircuitos integrados
dc.subject.unesco2203.07 Circuitos Integrados
dc.titleA portable low-cost SEU evaluation board for SRAMs
dc.typebook part
dcterms.references[1] T. Granlund, B. Granbom, and N. Olsson, “Soft error rate increase for new generations of SRAMs,” IEEE Trans. Nucl. Sci., vol. 50, pp. 2065–2068, December 2003. [2] J. F. Ziegler and W. A. Lanford, “The effect of sea level cosmic rays on electronic devices,” J. Appl. Phys., vol. 52, pp. 4305–4312, June 1981. [3] J. Olsen, P. E. Becher, P. B. Fynbo, P. Raaby, and J. Schultz, “Neutron- induced single event upsets in static RAMs observed at 10 km flight altitude,” IEEE Trans. Nucl. Sci., vol. 40, pp. 74–77, April 1993. [4] A. Taber and E. Normand, “Single event upset in avionics,” IEEE Trans. Nucl. Sci., vol. 40, pp. 120–126, April 1993. [5] K. W. Harris, “Asymmetries in soft-error rates in a large cluster system,” IEEE Trans. Dev. Mat. Reliab., vol. 5, pp. 336–342, September 2005. [6] P. D. Bradley and E. Normand, “Single event upsets in implantable cardioverter defibrillators,” IEEE Trans. Nucl. Sci., vol. 45, pp. 2929–2940, December 1998. [7] R. C. Baumann, Short Course in the Nuclear and Space Radiation Effects Conference (NSREC), ch. 2. Seattle (USA): IEEE Society, July 2005. [8] J. F. Ziegler and H. Puchner, SER - History, Trends and Challenges. A Guide for Designing with Memory ICs. Cypress Semiconductor, 2004. [9] C. W. Slayman, “Cache and memory error detection, correction, and reduction techniques for terrestrial servers and workstations,” IEEE Trans. Dev. Mat. Reliab., vol. 5, pp. 397–404, September 2005. [10] A. H. Johnston, “Scaling and technology issues for soft error rates,” in Proc. 4th Annual Research Conference on Reliability, (Stanford University (USA)), pp. 1–9, October 2000. [11] A. Lesea, S. Drimer, J. J. Fabula, C. Carmichael, and P. Alfke, “The rosetta experiment: Atmospheric soft error rate testing in differing technology fpgas,” IEEE Trans. Dev. Mat. Reliab., vol. 5, pp. 317–328, September 2005. [12] J. L. Autran, P. Roche, J. Borel, C. Sudre, K. Castellani-Coulie, D. Munteanu, T. Parrassin, G. Gasiot, and J. P. Schoellkopf, “Altitude SEE test european platform (ASTEP): Project overview, first results in CMOS 130nm and perspectives,” in Proceedings of the Radiation Effects on Component and Systems (RADECS) Workshop, (Athens (Greece)), p. In press, September 2006. [13] K. Johansson, P. Dyrekelev, B. Gramboml, M. C. Calvet, S. Fourtine, and O. Feuillatre, “In-flight and ground testing of single event upset sensitivity in static RAMs,” IEEE Trans. Nucl. Sci., vol. 45, pp. 1628–1632, June 1998.
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relation.isAuthorOfPublication662ba05f-c2fc-4ad7-9203-36924c80791a
relation.isAuthorOfPublication.latestForDiscovery662ba05f-c2fc-4ad7-9203-36924c80791a

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