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A portable low-cost SEU evaluation board for SRAMs

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http://dx.doi.org/10.1109/SCED.2007.384018

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Publication date

2007

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IEEE-Inst Electrical Electronics Engineers Inc
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https://hdl.handle.net/20.500.14352/53413

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Abstract

This paper describes a field test system to evaluate the sensitivity of SRAMs to the natural radiation coming from the interaction of cosmic rays with the atmosphere. Unlike other experiments, this system is optimized to be portable and autonomous in order to allow making the development of the tests more flexible.

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©IEEE. Spanish Conference on Electron Devices (6.2007.Madrid). This work was supported by the NICRON Project (Fault-Tolerant Design and Verification for Safety-Critical Applications built from Advanced Integrated Circuits), in the frame of the ALFA (América Latina Formación Académica) cooperation agreement.

UCM subjects

Electrónica (Física), Radiactividad, Circuitos integrados

Unesco subjects

2203.07 Circuitos Integrados

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