Divergence-based robust inference under proportional hazards model for one-shot device life-test
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2021
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Institute of Electrical and Electronics Engineers
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Abstract
In this paper, we develop robust estimators and tests for one-shot device testing under proportional hazards assumption based on divergence measures. Through a detailed Monte Carlo simulation study and a numerical example, the developed inferential procedures are shown to be more robust than the classical procedures, based on maximum likelihood estimators.