Aviso: para depositar documentos, por favor, inicia sesión e identifícate con tu cuenta de correo institucional de la UCM con el botón MI CUENTA UCM. No emplees la opción AUTENTICACIÓN CON CONTRASEÑA
 

Divergence-based robust inference under proportional hazards model for one-shot device life-test

Loading...
Thumbnail Image

Full text at PDC

Publication date

2021

Advisors (or tutors)

Editors

Journal Title

Journal ISSN

Volume Title

Publisher

Institute of Electrical and Electronics Engineers
Citations
Google Scholar

Citation

Abstract

In this paper, we develop robust estimators and tests for one-shot device testing under proportional hazards assumption based on divergence measures. Through a detailed Monte Carlo simulation study and a numerical example, the developed inferential procedures are shown to be more robust than the classical procedures, based on maximum likelihood estimators.

Research Projects

Organizational Units

Journal Issue

Description

Unesco subjects

Keywords

Collections