Para depositar en Docta Complutense, identifícate con tu correo @ucm.es en el SSO institucional. Haz clic en el desplegable de INICIO DE SESIÓN situado en la parte superior derecha de la pantalla. Introduce tu correo electrónico y tu contraseña de la UCM y haz clic en el botón MI CUENTA UCM, no autenticación con contraseña.

Anomalous resistivity at the structural phase transition of polycrystalline SnTe

Thumbnail Image

Download

Download AnomalousResistivity.pdf (1.21 MB)

Official URL

http://iopscience.iop.org/0022-3719/12/24/001

Full text at PDC

Publication date

1979

Authors

Advisors (or tutors)

Editors

Journal Title

Journal ISSN

Volume Title

Publisher

IOP Publishing
Citations
Google Scholar
Exportar
DC QDC MarcXML RDF MODS METS ORE-ATOM

URI

https://hdl.handle.net/20.500.14352/65103

Citation

Abstract

An excess resistivity has been observed in thin film polycrystalline samples of SnTe with low carrier concentration and is attributed to the additional scattering due to the phonon softening associated with the structural phase transition.

Research Projects

Organizational Units

Journal Issue

Description

@ 1979 The Institute of Physics

UCM subjects

Electrónica (Física), Física de materiales

Unesco subjects

Keywords

Collections

Artículos