Load resistor as a worst-case parameter to investigate single-event transients in analog electronic devices

Abstract

One of the main phenomena that commit the reliability of analog electronic systems working in the outer space is the presence of energetic ions that produce spurious transients after crossing the device. These pulses are transmitted to the network loading the device and can eventually lead to dangerous situations as it has been observed in some spatial missions. This paper shows how the value of the resistor loading the device can affect the shape of the transients.