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Evolution of lowest supply voltage and hysteresis phenomena in irradiated analog CMOS switches

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http://dx.doi.org/10.1109/REDW.2004.1352912

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2004

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IEEE-Inst Electrical Electronics Engineers Inc
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https://hdl.handle.net/20.500.14352/53407

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Abstract

Radiation tests on CMOS analog switches were carried out in order to select the most tolerant device for future use in the cryogenic system of the CERN large hadron collider. After irradiation, the devices showed some interesting changes related to the power supplies: an increase in the lowest supply voltage capable of biasing correctly the devices; some devices cannot work with TTL logic levels. In addition, hysteresis phenomena appear.

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© IEEE IEEE Radiation Effects Data Workshop (2004, Atlanta). This work was supported by the cooperation agreement K476/LHC between CERN and UCM, by the Spanish Research Agency CICYT (FPA2002-00912) and partially supported by ITN.

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Electrónica (Física), Radiactividad

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