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Using optimization techniques to characterize irradiated CMOS analog switches

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2004

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https://hdl.handle.net/20.500.14352/53399

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The use of mathematical optimization techniques allows estimating the degradation of the internal components of irradiated CMOS analog switches from their nonlinear resistance and the value of leakage currents at different power supplies voltages.

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Radiation Effects on Components and Systems (RADECS 2004) (5. 2004. Madrid) This work was supported by the cooperation agreement K746/LHC between CERN & UCM, by the Spanish Research Agency CICYT (FPA2002-00912) and partially supported by Instituto Tecnológico e Nuclear of Portugal.

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Electrónica (Física), Radiactividad

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