Statistical anomalies of bitflips in SRAMs to discriminate MCUs from SEUs
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2015
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IEEE-Inst Electrical Electronics Engineers Inc
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Abstract
This paper presents an approach to discern MCUs from SEUs in SRAM memories. Experiments involving radiation tests with 14-MeV neutrons on two successive generations (130 and 90 nm) of Cypress devices are presented.
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©IEEE 2015
European Conference on Radiation and Its Effects on Components and Systems (RADECS 2015) (15. 2015. Moscú).
Date of Conference: 14-18 Sept. 2015